Course Number 0581-5233-01
Course Name ATEM for Characterization of Materials
Academic Unit Faculty of Engineering -
Materials Science and Engineering
Lecturer Prof Amit KohnContact
Contact Email:
Office Hours By appointmentBuilding: Wolfson Mechanical Engineering , Room: 123
Mode of Instruction Lecture
Credit Hours 2
Semester 2020/2
Day Wed
Hours 16:00-19:00
Course is taught in English
Syllabus Not Found

Short Course Description

Analytical methods in transmission electron microscopy (TEM) and scanning TEM.

Analytical methods for characterizing the composition, structure, chemical bonding / electronic structure, electrostatic and magnetic fields, all at lateral resolutions ranging from nanometer scale to atomic-scale:

? Scanning TEM:
Configuration, Reciprocity theory
Z-contrast, High angle annular dark field: Contrast mechanisms, Contrast transfer function (comparison to TEM),
Aberration correction
? Spectroscopy: Physical background, lateral and energy resolution, data analysis methods for determining the composition and characterizing chemical bonding / electronic structure.
Electron Energy loss spectroscopy; Energy filtered TEM
Energy Dispersive X-ray Spectroscopy
? Mid resolution phase microscopy for mapping electrostatic and magnetic fields.
Electron holography
Differential Phase Contrast STEM

Full Syllabus
Course Requirements

Home Work

Students may be required to submit additional assignments
Full requirements as stated in full syllabus

PrerequisiteTransmission Elec' Micros (05814231)

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