Short Course Description
Analytical methods in transmission electron microscopy (TEM) and scanning TEM.
Analytical methods for characterizing the composition, structure, chemical bonding / electronic structure, electrostatic and magnetic fields, all at lateral resolutions ranging from nanometer scale to atomic-scale:
? Scanning TEM:
Configuration, Reciprocity theory
Z-contrast, High angle annular dark field: Contrast mechanisms, Contrast transfer function (comparison to TEM),
Aberration correction
? Spectroscopy: Physical background, lateral and energy resolution, data analysis methods for determining the composition and characterizing chemical bonding / electronic structure.
Electron Energy loss spectroscopy; Energy filtered TEM
Energy Dispersive X-ray Spectroscopy
? Mid resolution phase microscopy for mapping electrostatic and magnetic fields.
Electron holography
Differential Phase Contrast STEM
Full Syllabus
