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Syllabus

Course Number 0581-5332-01
Course Name Scanning Electron Microscopy
Academic Unit Faculty of Engineering -
Materials Science and Engineering
Lecturer Dr. Contact
Contact Email: barkay@tauex.tau.ac.il
Office HoursBy appointment
Mode of Instruction Lecture
Credit Hours 2
Semester 2020/2
Day Mon
Hours 15:00-17:00
Building
Room
Course is taught in English
Syllabus Not Found

Short Course Description

Credit Points: 2
Background to scanning electron microscopy (SEM). Electron-specimen interaction: models for elastic and inelastic interaction, Monte-Carlo simulation for electron-specimen interaction. Properties of main signals and X-ray microanalysis. Electron optics: electron sources, magnetic lenses and aberrations. Principles of image formation. Various SEM types including ESEM and advanced methods including Electron Backscattered Diffraction. Practical SEM aspects and various applications.

Note: the SEM laboratory course follows the SEM course and takes place at the third part of the semester.



Full syllabus is to be published
Course Requirements

Home Work

Students may be required to submit additional assignments
Full requirements as stated in full syllabus



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